“Emerging Paradigms in VLSI and Semiconductor Manufacturing Leveraging AI-Driven Process Control and Defect Detection Techniques” (2025) ISCSITR- INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND ENGINEERING (ISCSITR-IJCSE) - ISSN: 3067-7394, 6(1), pp. 1–5. Available at: https://iscsitr.in/index.php/ISCSITR-IJCSE/article/view/ISCSITR-IJCSE_2025_06_01_001 (Accessed: 23 July 2025).