Emerging Paradigms in VLSI and Semiconductor Manufacturing Leveraging AI-Driven Process Control and Defect Detection Techniques. ISCSITR- INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND ENGINEERING (ISCSITR-IJCSE) - ISSN: 3067-7394, [S. l.], v. 6, n. 1, p. 1–5, 2025. Disponível em: https://iscsitr.in/index.php/ISCSITR-IJCSE/article/view/ISCSITR-IJCSE_2025_06_01_001.. Acesso em: 23 jul. 2025.